tests/pyb: Adjust tests so they can run on PYB and PYBLITE.

A few tests still fail on PYBLITE, and that's due to differences in the
available peripheral block numbers on the different MCUs (eg I2C(2)
exists on one, but it's I2C(3) on the other).

tests/pyb/adc.py

@@ -9,9 +9,12 @@ print(adc)
 val = adc.read()
 assert val < 500
 
+# timer for read_timed
+tim = pyb.Timer(5, freq=500)
+
 # read into bytearray
 buf = bytearray(50)
-adc.read_timed(buf, 500)
+adc.read_timed(buf, tim)
 print(len(buf))
 for i in buf:
     assert i < 500
@@ -19,12 +22,12 @@ for i in buf:
 # read into arrays with different element sizes
 import array
 ar = array.array('h', 25 * [0])
-adc.read_timed(ar, 500)
+adc.read_timed(ar, tim)
 print(len(ar))
 for i in buf:
     assert i < 500
 ar = array.array('i', 30 * [0])
-adc.read_timed(ar, 500)
+adc.read_timed(ar, tim)
 print(len(ar))
 for i in buf:
     assert i < 500

tests/pyb/can.py

@@ -1,4 +1,10 @@
-from pyb import CAN
+try:
+    from pyb import CAN
+except ImportError:
+    print('SKIP')
+    import sys
+    sys.exit()
+
 import pyb
 
 # test we can correctly create by id or name

tests/pyb/dac.py

@@ -1,5 +1,10 @@
 import pyb
 
+if not hasattr(pyb, 'DAC'):
+    print('SKIP')
+    import sys
+    sys.exit()
+
 dac = pyb.DAC(1)
 print(dac)
 dac.noise(100)

tests/pyb/extint.py

@@ -1,7 +1,7 @@
 import pyb
 
 # test basic functionality
-ext = pyb.ExtInt('X1', pyb.ExtInt.IRQ_RISING, pyb.Pin.PULL_DOWN, lambda l:print('line:', l))
+ext = pyb.ExtInt('Y1', pyb.ExtInt.IRQ_RISING, pyb.Pin.PULL_DOWN, lambda l:print('line:', l))
 ext.disable()
 ext.enable()
 print(ext.line())

tests/pyb/extint.py.exp

@@ -1,3 +1,3 @@
-0
-line: 0
-line: 0
+6
+line: 6
+line: 6

tests/pyb/pin.py

@@ -1,14 +1,14 @@
 from pyb import Pin
 
-p = Pin('X1', Pin.IN)
+p = Pin('Y1', Pin.IN)
 print(p)
 print(p.name())
 print(p.pin())
 print(p.port())
 
-p = Pin('X1', Pin.IN, Pin.PULL_UP)
-p = Pin('X1', Pin.IN, pull=Pin.PULL_UP)
-p = Pin('X1', mode=Pin.IN, pull=Pin.PULL_UP)
+p = Pin('Y1', Pin.IN, Pin.PULL_UP)
+p = Pin('Y1', Pin.IN, pull=Pin.PULL_UP)
+p = Pin('Y1', mode=Pin.IN, pull=Pin.PULL_UP)
 print(p)
 print(p.value())
 

tests/pyb/pin.py.exp

@@ -1,10 +1,10 @@
-Pin(Pin.cpu.A0, mode=Pin.IN)
-A0
-0
-0
-Pin(Pin.cpu.A0, mode=Pin.IN, pull=Pin.PULL_UP)
+Pin(Pin.cpu.C6, mode=Pin.IN)
+C6
+6
+2
+Pin(Pin.cpu.C6, mode=Pin.IN, pull=Pin.PULL_UP)
 1
-Pin(Pin.cpu.A0, mode=Pin.IN, pull=Pin.PULL_DOWN)
+Pin(Pin.cpu.C6, mode=Pin.IN, pull=Pin.PULL_DOWN)
 0
 0
 1

tests/pyb/pyb1.py

@@ -27,14 +27,10 @@ print((pyb.millis() - start) // 5) # should print 3
 pyb.disable_irq()
 pyb.enable_irq()
 
-print(pyb.freq())
-
 print(pyb.have_cdc())
 
 pyb.hid((0, 0, 0, 0)) # won't do anything
 
-pyb.rng()
-
 pyb.sync()
 
 print(len(pyb.unique_id()))

tests/pyb/pyb1.py.exp

@@ -1,5 +1,4 @@
 3
 3
-(168000000, 168000000, 42000000, 84000000)
 True
 12

tests/pyb/pyb_f405.py

@@ -0,0 +1,11 @@
+# test pyb module on F405 MCUs
+
+import os, pyb
+
+if not 'STM32F405' in os.uname().machine:
+    print('SKIP')
+    import sys
+    sys.exit()
+
+print(pyb.freq())
+print(type(pyb.rng()))

tests/pyb/pyb_f405.py.exp

@@ -0,0 +1,2 @@
+(168000000, 168000000, 42000000, 84000000)
+<class 'int'>

tests/pyb/pyb_f411.py

@@ -0,0 +1,10 @@
+# test pyb module on F411 MCUs
+
+import os, pyb
+
+if not 'STM32F411' in os.uname().machine:
+    print('SKIP')
+    import sys
+    sys.exit()
+
+print(pyb.freq())

tests/pyb/pyb_f411.py.exp

@@ -0,0 +1 @@
+(96000000, 96000000, 24000000, 48000000)

tests/pyb/rtc.py

@@ -7,7 +7,7 @@ print(rtc)
 
 # make sure that 1 second passes correctly
 rtc.datetime((2014, 1, 1, 1, 0, 0, 0, 0))
-pyb.delay(1001)
+pyb.delay(1002)
 print(rtc.datetime()[:7])
 
 def set_and_print(datetime):